Showing posts with label Controllable and observable. Show all posts
Showing posts with label Controllable and observable. Show all posts

Controllability and observability - basics of DFT




What DFT is meant for: Design for Testability (DFT) is basically meant for providing a method for testing each and every node in the design for structural and other faults. Higher the number of nodes which can be tested through the targeted number of patterns, greater is the test coverage of the design. For this to be possible, every node in the design has to be controllable and observable. But what is controllability and observability? We can consider these as the two basic principles of DFT which are to be followed in order to have the maximum test coverage possible through minimum number of patterns. Let us discuss these.

Controllability: By controllability from DFT point of view, we intend if both ‘0’ and ‘1’ are able to propagate to each and every node within the target patterns.  A point is said to be controllable if both ‘0’ and ‘1’ can be propagated through scan patterns.

What if a node is not controllable: To achieve DFT coverage for a node, it is needed to be controllable. If a node is not controllable, it cannot be tested. For production mode devices, it is necessary to have certain minimum percentage of nodes controllable to ensure reliable devices to the customers. So, less number of controllable nodes mean less DFT coverage, and hence, less reliable devices.


Figure representing a case where a node has a large combinational cloud at the input resulting in the node being not controllable. This is because wither 0 or 1 may not be able to propagate to the node through specified number of patterns.

Figure 1 : Figure showing a node that is not controllable within targetted number of patterns


Inserting control points (enhancing controllability): A node can be made controllable by inserting control points. If the test coverage target is not getting met through target number of patterns, control points are inserted to increase the test coverage. A control point is an alternate path supplied to a node to let a particular value propagate to it. As shown in figure1, NODEA is not controllable within targeted number of patterns. We need to insert a control point in order to increase its controllability. As shown in figure2, an alternate path can be provided to NODEA controlled by enable signal. Adding control point at NODEA not only improves the controllability of NODEA, but it also improves the controllability of fanout cone of NODEA.


Control point can be inserted to make a point controllable. A control point provieds a direct controllable path to the node so as to let propagate the desired value to the desired node.

Figure 2 : Inserting control point to enhance controllability


       There can be three types of control points:
  • ‘0’ control points – Suppose we were earlier able to propagate ‘1’ to NODEA. We only need to let ‘0’ propagate. In that case, we can add a ‘0’ control point 
  •  ‘1’ control points - Suppose we were earlier able to propagate ‘0’ to NODEA. We only need to let ‘1’ propagate. In that case, we can add a ‘0’ control point 
  •  Flop control points – In order to let propagate both ‘0’ and ‘1’ through control points, flops need to be inserted.
In case of ‘0’ and ‘1’ control points, the control input of mux can be tied to ‘0’ or ‘1’. Hence, area overhead is only a mux. On the other hand, flop control points come with an overhead of an extra flop.

Observability: By observability, we mean out ability to measure the state of a logic signal. When we say that a node is observable, we mean that the value at the node can be shifted out through scan patterns and can be observed through scan out ports. 

What if a node is not observable: If a node is not observable, it means we cannot see the value at the node and it is not possible to see the value at that node through targeted number of patterns. To have scan coverage for the node, it is necessary to be observable. As in the case of less number of controllable nodes, if number of observable nodes is less, it means less scan coverage. So, less number of observable nodes also means less reliable devices. There may be many cases in which we cannot observe a node. The most common are the nodes connected to inputs of an analog block not having a scan chain inside. Since, analog blocks do not have scan chains, the input nodes cannot be observed in the normal scenario which renders the entire fanin logic unobserved.
 
A non-observable node as its output is not directly observable
Figure 3: Figure showing a non-observable node


How a node can be made observable: To improve the observability of nodes in the design, observe points are inserted. An observe point is a flip-flop inserted in the design that observes the value at one or more point. It has no functional purpose. It is inserted in the scan chain and shifts the observed data to scan out ports through scan shifting. A flip flop inserted as observe point can be used to observe a large number of hard-to-detect faults which results in a significant reduction in pattern count.


Making a non-observable node observable by providing a bypass path from the node to output
Figure 4 : Inserting observe point to enhance observability

        References 
  1. Test Point Insertion for Test Coverage Improvement in DFT - http://www.synopsys.com.cn/information/snug/2009/test-point-insertion-for-test-coverage-improvement-in-dft

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