VLSI UNIVERSE

DFT stands for Design For Testification. DFT engineers try to make the testing of design more cost effective by introducing some structure...

Both lockup latches and lockup registers are used to make scan chain robust to hold failures. What one uses for the same depends upon his/...

‘X’ refers to a signal attaining a value that is ‘unknown’. It can be either ‘0’ or ‘1’. But, the exact value of the signal is not known...

LBIST stands for Logic Built-In Self Test. As VLSI marches to deep sub-micron technologies, LBIST is gaining importance due to the unique ...

What are scan chains : Scan chains are the elements in scan-based designs that are used to shift-in and shift-out test data. A scan ...