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Showing posts with label
flip-flop
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Showing posts with label
flip-flop
.
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Setup checks and hold checks for latch-to-flop timing paths
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There can be 4 cases of latch-to-flop timing paths as discussed below: 1. Positive level-sensitive latch to positive edge-triggered regi...
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Scan chains – the backbone of DFT
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What are scan chains : Scan chains are the elements in scan-based designs that are used to shift-in and shift-out test data. A scan ...
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